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January 27, 2015 Tuesday 2:09 PM EST
WIPO PUBLISHES PATENT OF BEAM ENGINEERING FOR ADVANCED MEASUREMENTS,
BROOKHAVEN NATIONAL LABORATORY AND "YEREVAN STATE UNIVERSITY" STATE
NON-COMMERCIAL ORGANIZATION FOR "THE METHOD FOR REGISTRATION OF
CHANGES OF POLARIZATION STATE OF MONOCHROMATIC LIGHT RADIATION"
(ARMENIAN, AMERICAN INVENTORS)
GENEVA
GENEVA, Jan. 27 -- Publication No. WO/2015/006788 was published on Jan. 22.
Title of the invention: "THE METHOD FOR REGISTRATION OF CHANGES OF
POLARIZATION STATE OF MONOCHROMATIC LIGHT RADIATION." Applicants:
"YEREVAN STATE UNIVERSITY" STATE NON-COMMERCIAL ORGANIZATION (AM),
BEAM ENGINEERING FOR ADVANCED MEASUREMENTS CO. (US) and BROOKHAVEN
NATIONAL LABORATORY (US). Inventors: Hakob Margaryan (AM), Vladimir
Aroutiounian (AM), Nune Hakobyan (AM), David Hovhannisyan (AM),
Artashes Movsisyan (AM), Petros Gasparyan (AM) and Nelson Tabirian
(US). According to the abstract* posted by the World Intellectual
Property Organization: "The invention refers to optics, in particular
to the development of a new method for optical measurements.
Possible fields of the invention application are: polarimetry,
spectropolarimetry and ellipsometry. The invention proposes a method
for registration of changes in monochromatic light beam polarization,
based on using an axial symmetric liquid crystal phase retarder and a
polarization diffraction grating. The radial symmetric phase retarder
allows to create a unique correspondence between the state of incident
beam polarization vector and the intensity distribution of the radial
symmetric beam passed through the polarization diffraction grating
placed after the retarder. In the proposed method for registration of
changes in a monochromatic light beam polarization the state of
polarization vector is determined by values of Stokes' parameters,
obtained by a single measurement." The patent was filed on Nov. 15,
2013 under Application No. PCT/AM2013/000005. *For further
information, including images, charts and tables, please visit:
http://www.wipo.int/patentscope/search/en/detail.jsf?docId=WO2015006788
January 27, 2015 Tuesday 2:09 PM EST
WIPO PUBLISHES PATENT OF BEAM ENGINEERING FOR ADVANCED MEASUREMENTS,
BROOKHAVEN NATIONAL LABORATORY AND "YEREVAN STATE UNIVERSITY" STATE
NON-COMMERCIAL ORGANIZATION FOR "THE METHOD FOR REGISTRATION OF
CHANGES OF POLARIZATION STATE OF MONOCHROMATIC LIGHT RADIATION"
(ARMENIAN, AMERICAN INVENTORS)
GENEVA
GENEVA, Jan. 27 -- Publication No. WO/2015/006788 was published on Jan. 22.
Title of the invention: "THE METHOD FOR REGISTRATION OF CHANGES OF
POLARIZATION STATE OF MONOCHROMATIC LIGHT RADIATION." Applicants:
"YEREVAN STATE UNIVERSITY" STATE NON-COMMERCIAL ORGANIZATION (AM),
BEAM ENGINEERING FOR ADVANCED MEASUREMENTS CO. (US) and BROOKHAVEN
NATIONAL LABORATORY (US). Inventors: Hakob Margaryan (AM), Vladimir
Aroutiounian (AM), Nune Hakobyan (AM), David Hovhannisyan (AM),
Artashes Movsisyan (AM), Petros Gasparyan (AM) and Nelson Tabirian
(US). According to the abstract* posted by the World Intellectual
Property Organization: "The invention refers to optics, in particular
to the development of a new method for optical measurements.
Possible fields of the invention application are: polarimetry,
spectropolarimetry and ellipsometry. The invention proposes a method
for registration of changes in monochromatic light beam polarization,
based on using an axial symmetric liquid crystal phase retarder and a
polarization diffraction grating. The radial symmetric phase retarder
allows to create a unique correspondence between the state of incident
beam polarization vector and the intensity distribution of the radial
symmetric beam passed through the polarization diffraction grating
placed after the retarder. In the proposed method for registration of
changes in a monochromatic light beam polarization the state of
polarization vector is determined by values of Stokes' parameters,
obtained by a single measurement." The patent was filed on Nov. 15,
2013 under Application No. PCT/AM2013/000005. *For further
information, including images, charts and tables, please visit:
http://www.wipo.int/patentscope/search/en/detail.jsf?docId=WO2015006788